标题: 半导体硅片表面质量分析仪 [打印本页] 作者: wy_laser 时间: 2008-8-6 13:36 标题: 半导体硅片表面质量分析仪 Our all-new e-Xplorer system is designed to help increase precision and reduce costs in manufacturing semiconductor wafers. Its outstanding nanometric sensitivity enables the system to detect even the most elusive defects in form and planeness on wafers up to six inches in diameter. An optional zoom x3 option allows you to significantly increase the system's lateral resolution without compromising precision.
