标题: 直径1～12mm微光学元件特性分析仪 [打印本页] 作者: wy_laser 时间: 2008-8-6 13:42 标题: 直径1～12mm微光学元件特性分析仪 Total precision wavefront characterization of miniature optics and objectives
• precision wavefront characterization of aberrations
• measure back focal length (BFL), effective focal length (EFL), chromatism, field curvature, distortion, vignetting, and relative illumination as a function of the field
• calculate the 3D MTF and the MTF through-focus for all measured points in the field
• determine the best focal plane
The SL-Sys™ neo is a unique lens characterization solution designed for industrial R&D programs and for production line quality control. Based on Imagine Optic’s industry leading HASO™ wavefront sensor technology, the SL-Sys neo is the only commercially available system that enables you to completely characterize convergent (positive power) optical components 1-12 mm* in diameter of any numerical aperture over the entire field of view.
One of the many advantages of the SL-Sys neo is its ability to precisely measure the optical element’s aberrations as wavefront errors over the entire field of view and/or at any point therein. Contrary to systems that only provide simple Modulation Transfer Function (MTF) data, the precision wavefront data furnished by the SL-Sys neo enables you to move beyond rudimentary good/bad evaluation and into the domain of complete optical component analysis in order to identify the problem’s source.
In addition to wavefront aberrations, only the SL-Sys neo offers a 3-dimensional MTF measurement on all of the azimuths simultaneously. For the first time, you not only have access to the standard tangential and sagittal MTF curves on a single point, but equally to every other azimuth of the measured field in addition to the averaged MTF of all azimuths.
Lenses or objectives are easily loaded into the SL-Sys neo and users characterize the element via a fully-automated Windows XP interface that provides instant access to a host of valuable data.
The SL-Sys neo ensures precision measurements in part thanks to the meticulous optical conjugation between the wavefront sensor’s measurement plane and the measured element’s pupil. Its space-saving vertical design houses a dual wavelength HASO wavefront sensor functioning at 532 and 635 nm, and with microlens array resolutions’ of either 32x40 (SL-Sys – neo 32) or 76x100 (SL-Sys – neo 76). Key measurement characteristics include:
• ±45° field angle
• λ/100 aberration measurement sensitivity
• better than 0.005 MTF measurement sensitivity
• 1000 lp/mm maximum MTF frequency acquisition (automatically adjusted)
• better than 0.5% focal measurement sensitivity
In the lab or on the production floor, the data you receive enables you to act quickly and decisively to enhance designs or correct problems.
