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消像差Offner成像光谱仪的研究进展
Progress of Offner imaging spectrometers for eliminating aberration
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作 者:韩姗 黄元申 李柏承 张大伟 倪争技
HAN Shan, HUANG Yuanshen, LI Baicheng, ZHANG Dawei, NI Zhengji (Shanghai Key Laboratory of Modern Optical System, University of Shanghai for Science and Technology, 200093, China )
机构地区:上海理工大学上海市现代光学系统重点实验室,上海200093
出 处:《激光技术》 CSCD 2015年第39卷第1期 33-38页,共6页
Laser Technology
基 金:国家自然科学基金资助项目(61205156;11105149);国家重大科学仪器设备开发专项资助项目(2011YQ15004002;2011YQ15004004);上海市教委曙光资助项目(11SG44);上海市科技委科研计划资助项目(11DZ2290301);上海市研究生创新基金资助项目(JWCX-SL1302)
摘 要:为了获得消像差Offner成像光谱仪,以三镜系统为基础综述了Offner成像光谱仪的各种消像差方法,介绍了由两块不同曲率半径凹面镜与凸面光栅构成的Offner成像光谱仪和狭缝与刻槽成不同方向的Offner成像光谱仪的消像差方法,并得到面内结构及正交结构两种成像光谱仪结构,其中正交结构在消像差方面更具优势,为获得高质量Offner成像光谱仪提供了理论基础。
Research background and optical structure of an Offner imaging spectrometer were introduced. Aberration of the Offner imaging spectrometer was analyzed by analytical point row graph theory, single grating aberration theory and light path function analysis method respectively. Two special structures ( surface inner structure and orthogonal structure) were put forward, which can allow imaging spectrometer with better image quality. It is the research trend to improve the image quality of an imaging spectrometer in the future.
关键词:光学设计 消像差结构 像差理论 Offner成像光谱仪 凸面光栅
optical design ; eliminating aberration structure ; aberration theory ; Offner imaging spectrometer ; convex grating ; |
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